Structure of cathodically deposited nickel hexacyanoferrate thin films using XRD and EXAFS

William A. Steen, Sang Wook Han, Qiuming Yu, Robert A. Gordon, Julie Olmsted Cross, Edward A. Stern, Gerald T. Seidler, Kavita M. Jeerage, Daniel T. Schwartz

Research output: Contribution to journal › Article › peer-review

50 Scopus citations

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Chemistry

Physics

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Material Science