TY - JOUR
T1 - Structure determination of amorphous Ge, GeO2 and GeSe by fourier analysis of extended x-ray absorption fine structure (EXAFS)
AU - Sayers, Dale E.
AU - Lytle, Farrel W.
AU - Stern, Edward A.
PY - 1972/6
Y1 - 1972/6
N2 - Fourier inversion of EXAFS data is a powerful new technique for structural investigation of non-crystalline materials with the unique capability to determine the near neighbor environment of each type of atom in a complex material. The radial structure function so obtained contains information on the number, distance, and distribution of atoms surrounding the absorbing atom. The data on Ge and GeO2 generally agree with previous findings but with added detail. The environment of both Ge and Se in amorphous GeSe show a significant change from the crystalline material with evidence for local satisfaction of the directed bonding tendencies of each atomic species.
AB - Fourier inversion of EXAFS data is a powerful new technique for structural investigation of non-crystalline materials with the unique capability to determine the near neighbor environment of each type of atom in a complex material. The radial structure function so obtained contains information on the number, distance, and distribution of atoms surrounding the absorbing atom. The data on Ge and GeO2 generally agree with previous findings but with added detail. The environment of both Ge and Se in amorphous GeSe show a significant change from the crystalline material with evidence for local satisfaction of the directed bonding tendencies of each atomic species.
UR - http://www.scopus.com/inward/record.url?scp=18144440514&partnerID=8YFLogxK
U2 - 10.1016/0022-3093(72)90167-6
DO - 10.1016/0022-3093(72)90167-6
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AN - SCOPUS:18144440514
SN - 0022-3093
VL - 8-10
SP - 401
EP - 407
JO - Journal of Non-Crystalline Solids
JF - Journal of Non-Crystalline Solids
IS - C
ER -