Structure determination of amorphous Ge, GeO2 and GeSe by fourier analysis of extended x-ray absorption fine structure (EXAFS)

Dale E. Sayers, Farrel W. Lytle, Edward A. Stern

Research output: Contribution to journalArticlepeer-review

55 Scopus citations

Abstract

Fourier inversion of EXAFS data is a powerful new technique for structural investigation of non-crystalline materials with the unique capability to determine the near neighbor environment of each type of atom in a complex material. The radial structure function so obtained contains information on the number, distance, and distribution of atoms surrounding the absorbing atom. The data on Ge and GeO2 generally agree with previous findings but with added detail. The environment of both Ge and Se in amorphous GeSe show a significant change from the crystalline material with evidence for local satisfaction of the directed bonding tendencies of each atomic species.

Original languageEnglish
Pages (from-to)401-407
Number of pages7
JournalJournal of Non-Crystalline Solids
Volume8-10
Issue numberC
DOIs
StatePublished - Jun 1972
Externally publishedYes

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