In this paper we present a study that was aimed at performing a selective diffusion of Zn into CdTe. A single crystal CdTe wafer fabricated into a "tooth-like" structure which was further subjected to high temperature annealing in the presence of Zn vapour. The sample was then cut parallel to the diffusion direction and a Zn concentration analysis, using an electron microprobe, was performed. As expected, the stripe structure CdTe-CdZnTe-CdTe has been confirmed. The Zn decay profiles were fitted to a modified diffusion model, suggesting a bulk diffusion mechanism coupled with a surface reaction. Practical implementation of this stripe structure for an infrared light waveguide is being evaluated.