STED like microscopy based on plasma dispersion effect in silicon

Hadar Pinhas; Yossef Danan; Moshe Sinvani; Meir Danino; Zeev Zalevsky

doi:10.1364/COSI.2017.CTh3B.5

STED like microscopy based on plasma dispersion effect in silicon

Hadar Pinhas, Yossef Danan, Moshe Sinvani, Meir Danino, Zeev Zalevsky

Bar-Ilan University - The Alexander Kofkin Faculty of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

We present a new method for laser beam shaping, in silicon, based on plasma dispersion effect (PDE) and use it to overcome the diffraction resolution limit in silicon in approach similar to stimulated emission depletion (STED) scanning fluorescence microscopy.

Original language	English
Title of host publication	Computational Optical Sensing and Imaging, COSI 2017
Publisher	Optica Publishing Group (formerly OSA)
ISBN (Electronic)	9781943580293
ISBN (Print)	9781943580293
DOIs	https://doi.org/10.1364/COSI.2017.CTh3B.5
State	Published - 2017
Event	Computational Optical Sensing and Imaging, COSI 2017 - San Francisco, United States Duration: 26 Jun 2017 → 29 Jun 2017

Publication series

Name	Optics InfoBase Conference Papers
Volume	Part F46-COSI 2017
ISSN (Electronic)	2162-2701

Conference

Conference	Computational Optical Sensing and Imaging, COSI 2017
Country/Territory	United States
City	San Francisco
Period	26/06/17 → 29/06/17

Bibliographical note

Publisher Copyright:
© 2016 OSA.

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10.1364/COSI.2017.CTh3B.5

Cite this

@inproceedings{01500ff9a6f94ddb9d1ec69b44a8d60f,

title = "STED like microscopy based on plasma dispersion effect in silicon",

abstract = "We present a new method for laser beam shaping, in silicon, based on plasma dispersion effect (PDE) and use it to overcome the diffraction resolution limit in silicon in approach similar to stimulated emission depletion (STED) scanning fluorescence microscopy.",

author = "Hadar Pinhas and Yossef Danan and Moshe Sinvani and Meir Danino and Zeev Zalevsky",

note = "Publisher Copyright: {\textcopyright} 2016 OSA.; Computational Optical Sensing and Imaging, COSI 2017 ; Conference date: 26-06-2017 Through 29-06-2017",

year = "2017",

doi = "10.1364/COSI.2017.CTh3B.5",

language = "אנגלית",

isbn = "9781943580293",

series = "Optics InfoBase Conference Papers",

publisher = "Optica Publishing Group (formerly OSA)",

booktitle = "Computational Optical Sensing and Imaging, COSI 2017",

}

Pinhas, H, Danan, Y, Sinvani, M, Danino, M & Zalevsky, Z 2017, STED like microscopy based on plasma dispersion effect in silicon. in Computational Optical Sensing and Imaging, COSI 2017. Optics InfoBase Conference Papers, vol. Part F46-COSI 2017, Optica Publishing Group (formerly OSA), Computational Optical Sensing and Imaging, COSI 2017, San Francisco, United States, 26/06/17. https://doi.org/10.1364/COSI.2017.CTh3B.5

STED like microscopy based on plasma dispersion effect in silicon. / Pinhas, Hadar; Danan, Yossef; Sinvani, Moshe et al.
Computational Optical Sensing and Imaging, COSI 2017. Optica Publishing Group (formerly OSA), 2017. (Optics InfoBase Conference Papers; Vol. Part F46-COSI 2017).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - STED like microscopy based on plasma dispersion effect in silicon

AU - Pinhas, Hadar

AU - Danan, Yossef

AU - Sinvani, Moshe

AU - Danino, Meir

AU - Zalevsky, Zeev

PY - 2017

Y1 - 2017

N2 - We present a new method for laser beam shaping, in silicon, based on plasma dispersion effect (PDE) and use it to overcome the diffraction resolution limit in silicon in approach similar to stimulated emission depletion (STED) scanning fluorescence microscopy.

AB - We present a new method for laser beam shaping, in silicon, based on plasma dispersion effect (PDE) and use it to overcome the diffraction resolution limit in silicon in approach similar to stimulated emission depletion (STED) scanning fluorescence microscopy.

UR - http://www.scopus.com/inward/record.url?scp=85026322065&partnerID=8YFLogxK

U2 - 10.1364/COSI.2017.CTh3B.5

DO - 10.1364/COSI.2017.CTh3B.5

M3 - ???researchoutput.researchoutputtypes.contributiontobookanthology.conference???

AN - SCOPUS:85026322065

SN - 9781943580293

T3 - Optics InfoBase Conference Papers

BT - Computational Optical Sensing and Imaging, COSI 2017

PB - Optica Publishing Group (formerly OSA)

T2 - Computational Optical Sensing and Imaging, COSI 2017

Y2 - 26 June 2017 through 29 June 2017

ER -

STED like microscopy based on plasma dispersion effect in silicon

Abstract

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