Abstract
We present a new method for laser beam shaping, in silicon, based on plasma dispersion effect (PDE) and use it to overcome the diffraction resolution limit in silicon in approach similar to stimulated emission depletion (STED) scanning fluorescence microscopy.
Original language | English |
---|---|
Title of host publication | Computational Optical Sensing and Imaging, COSI 2017 |
Publisher | Optica Publishing Group (formerly OSA) |
ISBN (Electronic) | 9781943580293 |
ISBN (Print) | 9781943580293 |
DOIs | |
State | Published - 2017 |
Event | Computational Optical Sensing and Imaging, COSI 2017 - San Francisco, United States Duration: 26 Jun 2017 → 29 Jun 2017 |
Publication series
Name | Optics InfoBase Conference Papers |
---|---|
Volume | Part F46-COSI 2017 |
ISSN (Electronic) | 2162-2701 |
Conference
Conference | Computational Optical Sensing and Imaging, COSI 2017 |
---|---|
Country/Territory | United States |
City | San Francisco |
Period | 26/06/17 → 29/06/17 |
Bibliographical note
Publisher Copyright:© 2016 OSA.