Stark-ladder behavior of the X levels in a type-II GaAs/AlAs superlattice measured using electroreflectance spectroscopy

A. J. Shields; P. C. Klipstein; M. S. Skolnick; G. W. Smith; C. R. Whitehouse

doi:10.1103/physrevb.42.5879

Stark-ladder behavior of the X levels in a type-II GaAs/AlAs superlattice measured using electroreflectance spectroscopy

A. J. Shields, P. C. Klipstein, M. S. Skolnick, G. W. Smith, C. R. Whitehouse

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23 Scopus citations

Abstract

We have performed 17-K electroreflectance (ER) on a type-II (GaAs)10/(AlAs)8 superlattice (SL) as a function of electric field. We have resolved transitions to X-point levels confined in the AlAs, even though they are too weak to resolve in low-intensity photocurrent. The extra sensitivity of ER derives from the large field-induced energy shift of the transitions. Both the X-level Stark-ladder transitions increasing and decreasing in energy (m= 1/2) are clearly observed. As expected these have linear field evolution, with gradients in excellent agreement with the SL half-period.

Original language	English
Pages (from-to)	5879-5882
Number of pages	4
Journal	Physical Review B
Volume	42
Issue number	9
DOIs	https://doi.org/10.1103/physrevb.42.5879
State	Published - 1990
Externally published	Yes

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title = "Stark-ladder behavior of the X levels in a type-II GaAs/AlAs superlattice measured using electroreflectance spectroscopy",

abstract = "We have performed 17-K electroreflectance (ER) on a type-II (GaAs)10/(AlAs)8 superlattice (SL) as a function of electric field. We have resolved transitions to X-point levels confined in the AlAs, even though they are too weak to resolve in low-intensity photocurrent. The extra sensitivity of ER derives from the large field-induced energy shift of the transitions. Both the X-level Stark-ladder transitions increasing and decreasing in energy (m= 1/2) are clearly observed. As expected these have linear field evolution, with gradients in excellent agreement with the SL half-period.",

author = "Shields, {A. J.} and Klipstein, {P. C.} and Skolnick, {M. S.} and Smith, {G. W.} and Whitehouse, {C. R.}",

year = "1990",

doi = "10.1103/physrevb.42.5879",

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AU - Shields, A. J.

AU - Klipstein, P. C.

AU - Skolnick, M. S.

AU - Smith, G. W.

AU - Whitehouse, C. R.

PY - 1990

Y1 - 1990

N2 - We have performed 17-K electroreflectance (ER) on a type-II (GaAs)10/(AlAs)8 superlattice (SL) as a function of electric field. We have resolved transitions to X-point levels confined in the AlAs, even though they are too weak to resolve in low-intensity photocurrent. The extra sensitivity of ER derives from the large field-induced energy shift of the transitions. Both the X-level Stark-ladder transitions increasing and decreasing in energy (m= 1/2) are clearly observed. As expected these have linear field evolution, with gradients in excellent agreement with the SL half-period.

AB - We have performed 17-K electroreflectance (ER) on a type-II (GaAs)10/(AlAs)8 superlattice (SL) as a function of electric field. We have resolved transitions to X-point levels confined in the AlAs, even though they are too weak to resolve in low-intensity photocurrent. The extra sensitivity of ER derives from the large field-induced energy shift of the transitions. Both the X-level Stark-ladder transitions increasing and decreasing in energy (m= 1/2) are clearly observed. As expected these have linear field evolution, with gradients in excellent agreement with the SL half-period.

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ER -

Stark-ladder behavior of the X levels in a type-II GaAs/AlAs superlattice measured using electroreflectance spectroscopy

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