Spectral dependence of point defect production by x rays in RbBr

F. C. Brown, Tong De Jiang, D. L. Brewe, K. H. Kim, E. A. Stern

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1 Scopus citations


F-center formation by monochromatic x rays has been studied above and below the bromine and rubidium K-absorption edges in crystals of RbBr. The x-ray beam from a double silicon crystal monochromator on an undulator at the Advanced Photon Source was used to produce these point defects, which were detected by a sensitive laser-induced luminescence method. Experiments were carried out over a wide range of monochromatic x-ray intensity, with emphasis on the nearly linear initial slope of defect formation with exposure. No significant increase in F-center formation efficiency was found upon crossing the bromine K edge, which indicates that additional Auger-cascade mechanisms do not appreciably add to the usual multiple ionization electron-hole recombination processes known to generate point defects.

Original languageEnglish
Pages (from-to)7037-7042
Number of pages6
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number10
StatePublished - 1999
Externally publishedYes


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