Slit NSOM Imaging using Nanoscale Photodetector

Matityahu Karelits; Yaakov Mandelbaum; Avraham Chelly; Avi Karsenty

doi:10.1109/icsee.2018.8645971

Slit NSOM Imaging using Nanoscale Photodetector

Matityahu Karelits
, Yaakov Mandelbaum
, Avraham Chelly
, Avi Karsenty

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

As part of the sensitivity evaluation of a new sensor designed for Near-field Scanning Optical Microscopy (NSOM) and for detection of evanescent waves, advanced 2D simulations have been conducted: The photodetector device, shifted across a vertically oriented Gaussian beam, itself passing through a slit set on an opaque barrier, may collect the projected light on its top subwavelength aperture. The device is silicon Schottky nanoscale diode shaped as a truncated pyramid photodetector, and sharing a subwavelength slit aperture. Using Finite Elements Method (FEM) electro-optical simulations have been conducted. These results are promising towards the fabrication of a new generation of photodetector devices.

Original language	English
Title of host publication	2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781538663783
DOIs	https://doi.org/10.1109/icsee.2018.8645971
State	Published - 2 Jul 2018
Externally published	Yes
Event	2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018 - Eilat, Israel Duration: 12 Dec 2018 → 14 Dec 2018

Publication series

Name	2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018

Conference

Conference	2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018
Country/Territory	Israel
City	Eilat
Period	12/12/18 → 14/12/18

Bibliographical note

Publisher Copyright:
© 2018 IEEE.

Keywords

2D simulations
FEM
NSOM
evanescent waves
photodetector
silicon
slit sub-wavelength aperture

Access to Document

10.1109/icsee.2018.8645971

Cite this

Karelits, M., Mandelbaum, Y., Chelly, A., & Karsenty, A. (2018). Slit NSOM Imaging using Nanoscale Photodetector. In 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018 Article 8645971 (2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/icsee.2018.8645971

Karelits, Matityahu ; Mandelbaum, Yaakov ; Chelly, Avraham et al. / Slit NSOM Imaging using Nanoscale Photodetector. 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018. Institute of Electrical and Electronics Engineers Inc., 2018. (2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018).

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abstract = "As part of the sensitivity evaluation of a new sensor designed for Near-field Scanning Optical Microscopy (NSOM) and for detection of evanescent waves, advanced 2D simulations have been conducted: The photodetector device, shifted across a vertically oriented Gaussian beam, itself passing through a slit set on an opaque barrier, may collect the projected light on its top subwavelength aperture. The device is silicon Schottky nanoscale diode shaped as a truncated pyramid photodetector, and sharing a subwavelength slit aperture. Using Finite Elements Method (FEM) electro-optical simulations have been conducted. These results are promising towards the fabrication of a new generation of photodetector devices.",

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author = "Matityahu Karelits and Yaakov Mandelbaum and Avraham Chelly and Avi Karsenty",

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Karelits, M, Mandelbaum, Y, Chelly, A & Karsenty, A 2018, Slit NSOM Imaging using Nanoscale Photodetector. in 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018., 8645971, 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018, Institute of Electrical and Electronics Engineers Inc., 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018, Eilat, Israel, 12/12/18. https://doi.org/10.1109/icsee.2018.8645971

Slit NSOM Imaging using Nanoscale Photodetector. / Karelits, Matityahu; Mandelbaum, Yaakov; Chelly, Avraham et al.
2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018. Institute of Electrical and Electronics Engineers Inc., 2018. 8645971 (2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Karelits M, Mandelbaum Y, Chelly A, Karsenty A. Slit NSOM Imaging using Nanoscale Photodetector. In 2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018. Institute of Electrical and Electronics Engineers Inc. 2018. 8645971. (2018 IEEE International Conference on the Science of Electrical Engineering in Israel, ICSEE 2018). doi: 10.1109/icsee.2018.8645971

Slit NSOM Imaging using Nanoscale Photodetector

Abstract

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Bibliographical note

Keywords

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