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Slit height smearing correction in small angle X-ray scattering I: Intensity correction program

  • Moshe Deutsch

Research output: Contribution to journalArticlepeer-review

8 Scopus citations
Original languageEnglish
Pages (from-to)337-343
Number of pages7
JournalComputer Physics Communications
Volume17
Issue number4
DOIs
StatePublished - 1979

Bibliographical note

Funding Information:
The use of pinhole collimators in small angle X-ray scattering is impractical due to the low intensity obtained at the detector. Instead, long narrow slits, or their equivalents are used to collimate the beam. Consequently the measured intensity is an integral of the intensity scattered through a range of angles rather than the intensity scattered at the nominal measured angle \[1\].This effect is known as the slit-height smearing effect. To obtain the ideal intensity scattered at a unique angle, as if pinhole collimation was feasible, the data must be cor- * This work was supported by a grant from the United States—Israel Binational Science Foundation (BSF), Jerusalem, Israel.

Funding

The use of pinhole collimators in small angle X-ray scattering is impractical due to the low intensity obtained at the detector. Instead, long narrow slits, or their equivalents are used to collimate the beam. Consequently the measured intensity is an integral of the intensity scattered through a range of angles rather than the intensity scattered at the nominal measured angle \[1\].This effect is known as the slit-height smearing effect. To obtain the ideal intensity scattered at a unique angle, as if pinhole collimation was feasible, the data must be cor- * This work was supported by a grant from the United States—Israel Binational Science Foundation (BSF), Jerusalem, Israel.

Funders
United States-Israel Binational Science Foundation

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