| Original language | English |
|---|---|
| Pages (from-to) | 337-343 |
| Number of pages | 7 |
| Journal | Computer Physics Communications |
| Volume | 17 |
| Issue number | 4 |
| DOIs | |
| State | Published - 1979 |
Bibliographical note
Funding Information:The use of pinhole collimators in small angle X-ray scattering is impractical due to the low intensity obtained at the detector. Instead, long narrow slits, or their equivalents are used to collimate the beam. Consequently the measured intensity is an integral of the intensity scattered through a range of angles rather than the intensity scattered at the nominal measured angle \[1\].This effect is known as the slit-height smearing effect. To obtain the ideal intensity scattered at a unique angle, as if pinhole collimation was feasible, the data must be cor- * This work was supported by a grant from the United States—Israel Binational Science Foundation (BSF), Jerusalem, Israel.
Funding
The use of pinhole collimators in small angle X-ray scattering is impractical due to the low intensity obtained at the detector. Instead, long narrow slits, or their equivalents are used to collimate the beam. Consequently the measured intensity is an integral of the intensity scattered through a range of angles rather than the intensity scattered at the nominal measured angle \[1\].This effect is known as the slit-height smearing effect. To obtain the ideal intensity scattered at a unique angle, as if pinhole collimation was feasible, the data must be cor- * This work was supported by a grant from the United States—Israel Binational Science Foundation (BSF), Jerusalem, Israel.
| Funders |
|---|
| United States-Israel Binational Science Foundation |
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