Slit height smearing correction in small angle X-ray scattering III: Intensity correction program adaptation to arbitrary slit transmission function

Moshe Deutsch

doi:10.1016/0010-4655(79)90031-6

Slit height smearing correction in small angle X-ray scattering III: Intensity correction program adaptation to arbitrary slit transmission function

Moshe Deutsch

Department of Physics - at Bar-Ilan University

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Original language	English
Pages (from-to)	143-147
Number of pages	5
Journal	Computer Physics Communications
Volume	18
Issue number	1
DOIs	https://doi.org/10.1016/0010-4655(79)90031-6
State	Published - Sep 1979

Bibliographical note

Funding Information:
* This work was supported by a grant from the United States— Israel Binational Science Foundation (BSF), Jerusalem, Israel.

Funding

* This work was supported by a grant from the United States— Israel Binational Science Foundation (BSF), Jerusalem, Israel.

Funders	Funder number
United States-Israel Binational Science Foundation

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10.1016/0010-4655(79)90031-6

Cite this

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title = "Slit height smearing correction in small angle X-ray scattering III: Intensity correction program adaptation to arbitrary slit transmission function",

author = "Moshe Deutsch",

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Slit height smearing correction in small angle X-ray scattering III: Intensity correction program adaptation to arbitrary slit transmission function

Bibliographical note

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