Abstract
The evaluation of different scattering times from magnetoconductance measurements of thin metal films is not unique. The source of the ambiguity is discussed with a method to overcome the ambiguity. The analysis is demonstrated for a thin copper film.
| Original language | English |
|---|---|
| Title of host publication | Unknown Host Publication Title |
| Publisher | North Holland |
| Pages | 885-886 |
| Number of pages | 2 |
| Edition | pt 2 |
| ISBN (Print) | 0444869107 |
| State | Published - 1984 |
| Externally published | Yes |
Publication series
| Name | |
|---|---|
| Number | pt 2 |