Silicon Proven 1.8μm × 9.2 μm 65-nm Digital Bit Generator for Hardware Security Applications

David Zooker; Moshe Avital; Yoav Weizman; Alexander Fish; Osnat Keren

doi:10.1109/TCSII.2019.2929158

Silicon Proven 1.8μm × 9.2 μm 65-nm Digital Bit Generator for Hardware Security Applications

David Zooker
, Moshe Avital
, Yoav Weizman
, Alexander Fish
, Osnat Keren

Bar-Ilan University - The Alexander Kofkin Faculty of Engineering

Research output: Contribution to journal › Article › peer-review

2 Scopus citations

Abstract

Many circuit/gate level countermeasures require randomness to provide immunity against power analysis attacks. These applications usually require up to 64 bit sequences at different locations in the design in parallel. While these sequences are not required to be truly random, they must be independent. In this brief, we present, for the first time, results of silicon proven compact bit generator (cBG). The measurements prove that cBGs are able to amplify random fluctuations in the supply voltage to successfully produce the required bit sequences. The results show that less than 0.00014 random bits (out of 4 bits) are lost because of the negligible dependence between neighbouring generators. Additionally, the generators produce high enough entropy (minimum of 0.9656 over 10 Mbits) so they can be used as distributed generators for gate level countermeasures. The generators were tested with clock frequencies up to 100 MHz and the measured energy per bit of a single generator is 45 pJ@100 MHz.

Original language	English
Article number	8764429
Pages (from-to)	1713-1717
Number of pages	5
Journal	IEEE Transactions on Circuits and Systems II: Express Briefs
Volume	66
Issue number	10
DOIs	https://doi.org/10.1109/TCSII.2019.2929158
State	Published - Oct 2019

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

Funding

Manuscript received March 15, 2019; revised June 24, 2019; accepted June 30, 2019. Date of publication July 16, 2019; date of current version September 24, 2019. This work was supported by the Israel Science Foundation under Grant 1868/16 and Grant 932/16. This brief was recommended by Associate Editor M. Chakraborty. (Corresponding author: David Zooker.) The authors are with the Bar-Ilan University Faculty of Engineering, Ramat Gan 52900, Israel (e-mail: [email protected]).

Funders	Funder number
Israel Science Foundation	932/16, 1868/16

Keywords

Compact bit generator
hardware security

Access to Document

10.1109/TCSII.2019.2929158

Cite this

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title = "Silicon Proven 1.8μm {\texttimes} 9.2 μm 65-nm Digital Bit Generator for Hardware Security Applications",

abstract = "Many circuit/gate level countermeasures require randomness to provide immunity against power analysis attacks. These applications usually require up to 64 bit sequences at different locations in the design in parallel. While these sequences are not required to be truly random, they must be independent. In this brief, we present, for the first time, results of silicon proven compact bit generator (cBG). The measurements prove that cBGs are able to amplify random fluctuations in the supply voltage to successfully produce the required bit sequences. The results show that less than 0.00014 random bits (out of 4 bits) are lost because of the negligible dependence between neighbouring generators. Additionally, the generators produce high enough entropy (minimum of 0.9656 over 10 Mbits) so they can be used as distributed generators for gate level countermeasures. The generators were tested with clock frequencies up to 100 MHz and the measured energy per bit of a single generator is 45 pJ@100 MHz.",

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AU - Keren, Osnat

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Silicon Proven 1.8μm × 9.2 μm 65-nm Digital Bit Generator for Hardware Security Applications

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Keywords

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