Shock-induced twinning in polycrystalline vanadium: I. twinning stress

A. Hazan, G. Hillel, S. Kalabukhov, N. Frage, E. B. Zaretsky, L. Meshi

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The shock-induced twinning at room temperature was studied using 3 mm thick vanadium samples of commercial purity (99.8 wt%), softly recovered after planar impact loading by copper impactors with velocities ranging from 262 to 610 m/s. Microscopic (Light and Scanning Electron) examinations of the samples' cross-sections revealed twins in a strip of vanadium grains, located 100–900 μm apart from the impacted sample surface. Transmission electron microscopy characterization allowed concluding that these twins are produced by a/6 〈111〉{211} glide in subsequent {211} planes. The number of twins, Ntw, per unit area varied from its maximum value, measured at the distance h = 0.2–0.3 mm from the impacted sample surface, to Ntw = 0 at h = 0.7–0.9 mm apart from the surface. Juxtaposition of the presently obtained Ntw(h) dependencies with previously reported spatial distribution of the shear stress, τ(h), in shock-loaded vanadium samples made it possible to determine twinning stress in vanadium as: τ (Ntw = 0) = τtw = 0.68(±0.03) GPa.

Original languageEnglish
Article number111061
JournalMaterials Characterization
StatePublished - May 2021
Externally publishedYes

Bibliographical note

Funding Information:
Financial supports from the Israel Science Foundation (grant 441/18 ) to E.B. Zaretsky and N. Frage, and the Israeli Ministry of Defense (grant 8757643 ) to E.B. Zaretsky are gratefully acknowledged.

Publisher Copyright:
© 2021 Elsevier Inc.


  • Electron microscopy
  • Impact loading
  • Plastic deformation
  • Twinning stress
  • Twins
  • Vanadium


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