Shielding of impurities as measured by extended x-ray-absorption fine structure

Edward A. Stern, Dale E. Sayers

Research output: Contribution to journalArticlepeer-review

19 Scopus citations

Fingerprint

Dive into the research topics of 'Shielding of impurities as measured by extended x-ray-absorption fine structure'. Together they form a unique fingerprint.

Keyphrases

Physics