Shielding of impurities as measured by extended x-ray-absorption fine structure

Edward A. Stern, Dale E. Sayers

Research output: Contribution to journalArticlepeer-review

19 Scopus citations


A new theory of the extended x-ray-absorption fine structure (EXAFS) is presented which avoids the inaccurate approximations of previous ones. It is shown that, in addition to structure determination, EXAFS gives detailed information on the shielding of the singly ionized absorbing atom. Experimental verification of the theory is obtained from EXAFS data for Ge and Cu, explicitly showing shielding oscillations for Cu.

Original languageEnglish
Pages (from-to)174-177
Number of pages4
JournalPhysical Review Letters
Issue number5
StatePublished - 1973
Externally publishedYes

Bibliographical note

Funding Information:
Research supported in part by the Advanced Research Projects Agency of the Department of Defense and monitored by U. S. Army Research Office (Durham) under Contract No. DAHC04-71-C0010.

Funding Information:
Research sponsored by the U. S. Air Force Office of Scientific Research, Air Force Systems Command, under Grant No. AFOSR-71-1967B.


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