Abstract
Enhanced laser beam shaping for super-resolved imaging in silicon is demonstrated by applying pico-seconds pulsed pump at 775nm having increased penetration-depth into the silicon (than pump at 532nm) and yielding sharper PSF due to reduced diffusion effect of the generated free-charge-carriers.
| Original language | English |
|---|---|
| Title of host publication | Computational Optical Sensing and Imaging, COSI 2019 |
| Publisher | Optica Publishing Group (formerly OSA) |
| ISBN (Print) | 9781943580637 |
| DOIs | |
| State | Published - 2019 |
| Event | Computational Optical Sensing and Imaging, COSI 2019 - Munich, Germany Duration: 24 Jun 2019 → 27 Jun 2019 |
Publication series
| Name | Optics InfoBase Conference Papers |
|---|---|
| Volume | Part F170-COSI 2019 |
| ISSN (Electronic) | 2162-2701 |
Conference
| Conference | Computational Optical Sensing and Imaging, COSI 2019 |
|---|---|
| Country/Territory | Germany |
| City | Munich |
| Period | 24/06/19 → 27/06/19 |
Bibliographical note
Publisher Copyright:© OSA 2019 © 2019 The Author(s)