Abstract
We pattern submicrometer structures of thin films of permalloy in the form of two crossing ellipses and in the form of one long ellipse crossed by several ellipses where the width of the ellipses varies between 100 and 1000 nm. We find that the crossing area has two stable axes of magnetization, which are perpendicular to each other and which are rotated by 45 degrees relative to the axes of the ellipses. We measure the planar Hall effect (PHE) of the submicrometer structures and demonstrate sharp switching behavior between the two easy axes of the magnetization. The observed behavior is modeled analytically with bi-axial magnetic anisotropy and compared with numerical simulations. We discuss possible application of such submicrometer structures for PHE-based magnetic memory.
Original language | English |
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Article number | 07C715 |
Journal | Journal of Applied Physics |
Volume | 111 |
Issue number | 7 |
DOIs | |
State | Published - 1 Apr 2012 |
Bibliographical note
Funding Information:L.K. acknowledges support by the Israel Science Foundation founded by the Israel Academy of Science and Humanities. The content of this manuscript is patent-pending.
Funding
L.K. acknowledges support by the Israel Science Foundation founded by the Israel Academy of Science and Humanities. The content of this manuscript is patent-pending.
Funders | Funder number |
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Israel Academy of Sciences and Humanities | |
Israel Science Foundation |