Sequential circuits applicable for detecting different types of faults

I. Levin; V. Sinelnikov; M. Karpovsky; S. Ostanin

doi:10.1109/olt.2002.1030182

Sequential circuits applicable for detecting different types of faults

I. Levin, V. Sinelnikov, M. Karpovsky, S. Ostanin

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

This paper presents methods for designing totally self-checking Mealy type synchronous sequential circuits (SSCs). We use implementations of the output and next state functions that are monotonic in state variables. The monotony enables the SSC to react to permanent faults differently than it does to transient faults. If the fault is permanent, the SSC will produce a non-code output, which will be detected as error by the checker after a number of clock cycles. In the case of a transient fault, the SSC is able to survive and to return to normal operation after a number of clock cycles. A novel universal architecture of self-checking SSCs enabling to overcome the above contradiction is proposed. This architecture can be adopted both for reduction of the fault latency of a permanent fault and for increasing the SSC survivability with respect to a transient fault. A method for SSC synthesis for the proposed architecture is presented. This method is oriented to FPGA implementation.

Original language	English
Title of host publication	Proceedings of the 8th IEEE International On-Line Testing Workshop, IOLTW 2002
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	44-48
Number of pages	5
ISBN (Electronic)	0769516416, 9780769516417
DOIs	https://doi.org/10.1109/olt.2002.1030182
State	Published - 2002
Externally published	Yes
Event	8th IEEE International On-Line Testing Workshop, IOLTW 2002 - Isle of Bendor, France Duration: 8 Jul 2002 → 10 Jul 2002

Publication series

Name	Proceedings of the 8th IEEE International On-Line Testing Workshop, IOLTW 2002

Conference

Conference	8th IEEE International On-Line Testing Workshop, IOLTW 2002
Country/Territory	France
City	Isle of Bendor
Period	8/07/02 → 10/07/02

Bibliographical note

Publisher Copyright:
© 2002 IEEE.

Funding

This research was supported by BSF under grant No. 9800154

Funders	Funder number
United States-Israel Binational Science Foundation	9800154

Access to Document

10.1109/olt.2002.1030182

Cite this

Levin, I., Sinelnikov, V., Karpovsky, M., & Ostanin, S. (2002). Sequential circuits applicable for detecting different types of faults. In Proceedings of the 8th IEEE International On-Line Testing Workshop, IOLTW 2002 (pp. 44-48). Article 1030182 (Proceedings of the 8th IEEE International On-Line Testing Workshop, IOLTW 2002). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/olt.2002.1030182

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abstract = "This paper presents methods for designing totally self-checking Mealy type synchronous sequential circuits (SSCs). We use implementations of the output and next state functions that are monotonic in state variables. The monotony enables the SSC to react to permanent faults differently than it does to transient faults. If the fault is permanent, the SSC will produce a non-code output, which will be detected as error by the checker after a number of clock cycles. In the case of a transient fault, the SSC is able to survive and to return to normal operation after a number of clock cycles. A novel universal architecture of self-checking SSCs enabling to overcome the above contradiction is proposed. This architecture can be adopted both for reduction of the fault latency of a permanent fault and for increasing the SSC survivability with respect to a transient fault. A method for SSC synthesis for the proposed architecture is presented. This method is oriented to FPGA implementation.",

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Levin, I, Sinelnikov, V, Karpovsky, M & Ostanin, S 2002, Sequential circuits applicable for detecting different types of faults. in Proceedings of the 8th IEEE International On-Line Testing Workshop, IOLTW 2002., 1030182, Proceedings of the 8th IEEE International On-Line Testing Workshop, IOLTW 2002, Institute of Electrical and Electronics Engineers Inc., pp. 44-48, 8th IEEE International On-Line Testing Workshop, IOLTW 2002, Isle of Bendor, France, 8/07/02. https://doi.org/10.1109/olt.2002.1030182

Sequential circuits applicable for detecting different types of faults. / Levin, I.; Sinelnikov, V.; Karpovsky, M. et al.
Proceedings of the 8th IEEE International On-Line Testing Workshop, IOLTW 2002. Institute of Electrical and Electronics Engineers Inc., 2002. p. 44-48 1030182 (Proceedings of the 8th IEEE International On-Line Testing Workshop, IOLTW 2002).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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Levin I, Sinelnikov V, Karpovsky M, Ostanin S. Sequential circuits applicable for detecting different types of faults. In Proceedings of the 8th IEEE International On-Line Testing Workshop, IOLTW 2002. Institute of Electrical and Electronics Engineers Inc. 2002. p. 44-48. 1030182. (Proceedings of the 8th IEEE International On-Line Testing Workshop, IOLTW 2002). doi: 10.1109/olt.2002.1030182

Sequential circuits applicable for detecting different types of faults

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