TY - GEN
T1 - Security Aware Pseudo-Asynchronous Circuit Design Style
AU - Fish, A.
AU - Levi, I.
AU - Keren, O.
N1 - Place of conference:Greece
PY - 2017
Y1 - 2017
N2 - The increasing demand for electronic systems with increasing bandwidth and decreasing size puts more high-speed
circuitry and high bandwidth channels in ever-closer proximity. System-on-a-chip (SoC) integration places complex
high speed digital circuitry, analog and RF blocks very closely together. Note that most EDA tools are geared for a
specific design type (digital, analog, RF, etc.) However, there are many challenges caused by the interaction across
various blocks. These challenges are not limited by the boundaries or types of the various design components, or by
the types of analyses that designers are used to regularly run on less complex homogenous designs. Most notable
among these interdisciplinary mixed signal SOC challenges include:
• Verification of behavioral and electrical correctness
• Security verification
• Electromagnetic Crosstalk interference analysis and signoff
AB - The increasing demand for electronic systems with increasing bandwidth and decreasing size puts more high-speed
circuitry and high bandwidth channels in ever-closer proximity. System-on-a-chip (SoC) integration places complex
high speed digital circuitry, analog and RF blocks very closely together. Note that most EDA tools are geared for a
specific design type (digital, analog, RF, etc.) However, there are many challenges caused by the interaction across
various blocks. These challenges are not limited by the boundaries or types of the various design components, or by
the types of analyses that designers are used to regularly run on less complex homogenous designs. Most notable
among these interdisciplinary mixed signal SOC challenges include:
• Verification of behavioral and electrical correctness
• Security verification
• Electromagnetic Crosstalk interference analysis and signoff
UR - http://toc.proceedings.com/35989webtoc.pdf
M3 - Conference contribution
BT - 2nd IEEE International Verification and Security Workshop
ER -