Secondary Electron Cloaking with Broadband Plasmonic Resonant Absorbers

Moshik Cohen, Adi Salomon

Research output: Contribution to journalArticlepeer-review

12 Scopus citations


Scanning electron microscopy (SEM) is one of the most powerful tools for nanoscale inspection and imaging. It is broadly used for biomedicine, materials science, and nanotechnology, enabling spatial resolution beyond the optical diffraction limit. In SEM, a high-energy electron beam illuminates a specimen, and the emitted secondary electrons are routed to a positively biased, synchronized detector for image creation. Here, for the first time, we experimentally demonstrate a cloaking of metallic objects from a secondary electron image. We make a metallic disc with a diameter of 300 nm almost invisible to a secondary electron detector with <5 nm spatial resolution. The secondary electron cloaking is based on broadband optical radiation absorption in the near field. Our secondary electron images are in good agreement with full-wave numerical solution of Maxwell's equations at optical frequencies, confirming the concept of secondary electron cloaking based on broadband optical radiation absorption.

Original languageEnglish
Pages (from-to)3912-3916
Number of pages5
JournalJournal of Physical Chemistry Letters
Issue number16
StatePublished - 17 Aug 2017

Bibliographical note

Publisher Copyright:
© 2017 American Chemical Society.


This work was support by the GIF Grant no. 203785.

FundersFunder number
German-Israeli Foundation for Scientific Research and Development203785


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