Abstract
Electronic properties of initially homogeneous (Hg,Cd)Te samples have been modified on a local scale, in a stable manner at room temperature, by reverse biasing of small-area Schottky contacts on them. This was shown, after the bias voltage had been lifted, by current-voltage measurements and by electron beam-induced current scans. The creation of a clear diodelike structure in the vicinity of the Schottky contact on a scale of about hundred μm could be explained by electromigration of electrically active ions and/or by generation of point and line defects. The latter type of defect was revealed by chemical etch after application of the field.
| Original language | English |
|---|---|
| Pages (from-to) | 2428-2430 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 61 |
| Issue number | 20 |
| DOIs | |
| State | Published - 1992 |
| Externally published | Yes |
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