RF Leakage in Embedded Devices: Security and Reliability Risks

Erez Danieli; Yoav Weizman; David Popovtzer; Itamar Levi

doi:10.1109/mdat.2025.3602736

RF Leakage in Embedded Devices: Security and Reliability Risks

Erez Danieli
, Yoav Weizman
, David Popovtzer
, Itamar Levi

Bar-Ilan University - The Alexander Kofkin Faculty of Engineering

Bar-Ilan University

Research output: Contribution to journal › Article › peer-review

Abstract

Editor’s notes: Electromagnetic (EM) leakage has become a serious issue for several embedded systems. The authors, through mathematical modeling, demonstrate the need for improved coverage and detection techniques for these EM-based security challenges.

Original language	English
Pages (from-to)	58-71
Number of pages	14
Journal	IEEE Design and Test
Volume	43
Issue number	1
DOIs	https://doi.org/10.1109/mdat.2025.3602736
State	Published - 2026

Bibliographical note

Publisher Copyright:
© 2013 IEEE.

Keywords

EMI/EMC Standards
Embedded Systems
Hardware Security
PCIe Leakage
Phase Noise
RF Leakage
Side-Channel Attacks

Access to Document

10.1109/mdat.2025.3602736

Cite this

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abstract = "Editor{\textquoteright}s notes: Electromagnetic (EM) leakage has become a serious issue for several embedded systems. The authors, through mathematical modeling, demonstrate the need for improved coverage and detection techniques for these EM-based security challenges.",

keywords = "EMI/EMC Standards, Embedded Systems, Hardware Security, PCIe Leakage, Phase Noise, RF Leakage, Side-Channel Attacks",

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KW - Side-Channel Attacks

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RF Leakage in Embedded Devices: Security and Reliability Risks

Abstract

Bibliographical note

Keywords

Access to Document

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