Abstract
In this work, we are studying the effect of the technology scaling for different full-wave rectifier topologies using the Cross-Coupled Differential Drive (CCDD) strategy to implement a multiplier. For a conventional CCDD scaling from 90nm to 32nm, the PCE and VCE are maintained the same while a large degradation of the dynamic range and sensitivity are observed. This effect could be slightly limited by using a self-body bias CCDD topology. However, the use of TFET enables to avoid this degradation and provide a large VCE and output voltage for input voltage lower than 300mV. To extend this VCE for input voltage>300mV, we use a CCDD topology increasing the loading drive capability. Interestingly, this resulted not only on increasing the output voltage for large Vin but also demonstrated larger PCE than expected for this topology.
Original language | English |
---|---|
Title of host publication | 2021 IEEE 12th Latin American Symposium on Circuits and Systems, LASCAS 2021 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9781728176703 |
DOIs | |
State | Published - 21 Feb 2021 |
Externally published | Yes |
Event | 12th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2021 - Arequipa, Peru Duration: 22 Feb 2021 → 25 Feb 2021 |
Publication series
Name | 2021 IEEE 12th Latin American Symposium on Circuits and Systems, LASCAS 2021 |
---|
Conference
Conference | 12th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2021 |
---|---|
Country/Territory | Peru |
City | Arequipa |
Period | 22/02/21 → 25/02/21 |
Bibliographical note
Publisher Copyright:© 2021 IEEE.
Keywords
- 32nm
- CCDD
- Multiplier
- PCE
- TFET
- VCE
- full wave rectifier