TY - GEN
T1 - Reduction of fault latency in sequential circuits by using decomposition
AU - Levin, Ilya
AU - Abramov, Benjamin
AU - Ostrovsky, Vladimir
PY - 2007
Y1 - 2007
N2 - The paper discusses a novel approach for reduction of fault detection latency in a selfchecking sequential circuit. The Authors propose decomposing the finite state machine (FSM) which describes the sequential circuit of interest, thus obtaining a number of component FSMs respectively describing the number of component circuits. Being decomposed to the number of component circuits, the initial circuit becomes able to detect faults much faster since, at each specific moment of time, one of the component circuits (FSMs) is working and all the others are being tested. The paper deals with the following aspects: a) the decomposition procedure; b) evaluation of the proposed approach based on a fault injection simulation; c) estimation of trade-off between the reduction of latency and the required hardware overhead. Results of the study are tested on a number of standard benchmarks.
AB - The paper discusses a novel approach for reduction of fault detection latency in a selfchecking sequential circuit. The Authors propose decomposing the finite state machine (FSM) which describes the sequential circuit of interest, thus obtaining a number of component FSMs respectively describing the number of component circuits. Being decomposed to the number of component circuits, the initial circuit becomes able to detect faults much faster since, at each specific moment of time, one of the component circuits (FSMs) is working and all the others are being tested. The paper deals with the following aspects: a) the decomposition procedure; b) evaluation of the proposed approach based on a fault injection simulation; c) estimation of trade-off between the reduction of latency and the required hardware overhead. Results of the study are tested on a number of standard benchmarks.
UR - http://www.scopus.com/inward/record.url?scp=84887427260&partnerID=8YFLogxK
U2 - 10.1109/dft.2007.24
DO - 10.1109/dft.2007.24
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AN - SCOPUS:84887427260
SN - 0769528856
SN - 9780769528854
T3 - Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
SP - 261
EP - 269
BT - Proceedings - 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007
T2 - 22nd IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems, DFT 2007
Y2 - 26 September 2007 through 28 September 2007
ER -