Raman Characterization of Metal-Oxide PV Layers

Original language	American English
State	Published - 2013
Event	All Oxide Photovoltaics: Theory and Experiment - Jerusalem, Israel Duration: 16 Dec 2013 → 18 Dec 2013

Conference

Conference	All Oxide Photovoltaics: Theory and Experiment
Country/Territory	Israel
City	Jerusalem
Period	16/12/13 → 18/12/13

Activities

• 1 Invited talk

Activities per year

• Conference Invited Keynote

  Tischler, Y. R. (Keynote speaker)

  16 Dec 2013 → 18 Dec 2013

  Activity: Talk or presentation › Invited talk

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Tischler, Y. (2013). Raman Characterization of Metal-Oxide PV Layers. Paper presented at All Oxide Photovoltaics: Theory and Experiment, Jerusalem, Israel.

Tischler, Y. / Raman Characterization of Metal-Oxide PV Layers. Paper presented at All Oxide Photovoltaics: Theory and Experiment, Jerusalem, Israel.

@conference{512371f21c6a477094b5b648e9f1fe2a,

title = "Raman Characterization of Metal-Oxide PV Layers",

author = "Y. Tischler",

year = "2013",

language = "American English",

note = "All Oxide Photovoltaics: Theory and Experiment ; Conference date: 16-12-2013 Through 18-12-2013",

}

Tischler, Y 2013, 'Raman Characterization of Metal-Oxide PV Layers', Paper presented at All Oxide Photovoltaics: Theory and Experiment, Jerusalem, Israel, 16/12/13 - 18/12/13.

Raman Characterization of Metal-Oxide PV Layers. / Tischler, Y.
2013. Paper presented at All Oxide Photovoltaics: Theory and Experiment, Jerusalem, Israel.

Research output: Contribution to conference › Paper › peer-review

TY - CONF

T1 - Raman Characterization of Metal-Oxide PV Layers

AU - Tischler, Y.

PY - 2013

Y1 - 2013

M3 - Paper

T2 - All Oxide Photovoltaics: Theory and Experiment

Y2 - 16 December 2013 through 18 December 2013

ER -

Tischler Y. Raman Characterization of Metal-Oxide PV Layers. 2013. Paper presented at All Oxide Photovoltaics: Theory and Experiment, Jerusalem, Israel.