Radiation characterization of a dual core LEON3-FT processor

Keyphrases

• Dual-core 100%
• LEON3 100%
• By Design 50%
• 32-bit 50%
• Fault-tolerant 50%
• CMOS Process 50%
• Single Event Upset 50%
• Radiation Effects 50%
• Intellectual Property 50%
• Design Library 50%
• Shallow Trench Isolation 50%
• Radiation Test 50%
• Space Environment 50%
• Total Ionizing Dose 50%
• Single Event Latchup 50%
• Bit Faults 50%
• Radiation Hardness 50%
• Data Restore 50%
• Correction Data 50%

Earth and Planetary Sciences

• Trench 100%
• CMOS 100%
• Single Event Upset 100%
• Radiation Physics 100%
• Aerospace Environment 100%
• Latch-Up 100%

Engineering

• Test Result 100%
• Single Event Upset 100%
• Shallow Trench Isolation 100%
• Radiation Effect 100%