@inproceedings{c730321efc80486d83d689b00c802126,
title = "Radiation characterization of a dual core LEON3-FT processor",
abstract = "GR712RC is a dual core 32-bit fault-tolerant SPARC{\texttrademark}V8/LEON3-FT processor that has been developed and manufactured by Ramon Chip Ltd and AeroflexGaisler AB and characterized for radiation effects. It is designed with AeroflexGaisler's intellectual property and implemented with Ramon Chip's RadSafe{\texttrademark} radiation-hard-by-design library in a commercial 0.18μm shallow trench isolation CMOS process. Radiation test results for total ionizing dose, single event latch-up and single event upset data with correction/data-restore methodologies are reported, demonstrating its suitability for operating in a space environment.",
keywords = "Error correction, Processor, Single Event Upsets, Total Ionizing Dose",
author = "F. Sturesson and J. Gaisler and R. Ginosar and T. Liran",
year = "2011",
doi = "10.1109/radecs.2011.6131334",
language = "אנגלית",
isbn = "9781457705878",
series = "Proceedings of the European Conference on Radiation and its Effects on Components and Systems, RADECS",
pages = "938--944",
booktitle = "RADECS 2011 - 12th European Conference on Radiation and Its Effects on Component and Systems, Conference Proceedings",
note = "12th European Conference on Radiation and Its Effects on Component and Systems, RADECS 2011 ; Conference date: 19-09-2011 Through 23-09-2011",
}