Radial mask for imaging systems that exhibit high resolution and extended depths of field

Eyal Ben-Eliezer; Emanuel Marom; Naim Konforti; Zeev Zalevsky

doi:10.1364/ao.45.002001

Radial mask for imaging systems that exhibit high resolution and extended depths of field

Eyal Ben-Eliezer, Emanuel Marom, Naim Konforti, Zeev Zalevsky

Electro-Optics

Tel Aviv University

Research output: Contribution to journal › Article › peer-review

34 Scopus citations

Abstract

A novel algorithm for the design of an imaging system that exhibits high resolution as well as extended depth of field is presented. This novel approach searches for an optimal pupil mask that minimizes the value of the mean-square error when performed over the intensity rather than in the field distribution of the acquired image. The captured images in such system do not require any postprocessing, and thus utilization of such a system is simplified. Simulations as well as experimental results are provided.

Original language	English
Pages (from-to)	2001-2013
Number of pages	13
Journal	Applied Optics
Volume	45
Issue number	9
DOIs	https://doi.org/10.1364/ao.45.002001
State	Published - 20 Mar 2006

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10.1364/ao.45.002001

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Radial mask for imaging systems that exhibit high resolution and extended depths of field

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