Quantum weak-interaction-based measurement: from sequential weak measurement to protective measurement

E. Rebufello, S. Virzi, F. Piacentini, A. Avella, F. Zappa, R. Lussana, F. Villa, A. Tosi, M. Gramegna, G. Brida, E. Cohen, M. Barbieri, I.P. Degiovanni, M. Genovese

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageAmerican English
Title of host publicationSPIE Optical Engineering + Applications
StatePublished - 2018

Bibliographical note

Place of conference:San Diego, California, United States

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