Quantum interferometry with x-rays

Y. Klein, E. Strizhevsky, H. Aknin, M. Deutsch, E. Cohen, A. Peer, K. Tamasaku, T. Schulli, E. Karimi, S. Shwartz

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We demonstrate the pioneering use of a quantum interferometer with x-rays, highlighting its effectiveness in precisely measuring the phase accumulated in opaque media. Our work uncovers novel opportunities for measuring sub-Angstrom optical-path differences.

Original languageEnglish
Title of host publication2024 Conference on Lasers and Electro-Optics, CLEO 2024
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781957171395
StatePublished - 2024
Event2024 Conference on Lasers and Electro-Optics, CLEO 2024 - Charlotte, United States
Duration: 7 May 202410 May 2024

Publication series

Name2024 Conference on Lasers and Electro-Optics, CLEO 2024

Conference

Conference2024 Conference on Lasers and Electro-Optics, CLEO 2024
Country/TerritoryUnited States
CityCharlotte
Period7/05/2410/05/24

Bibliographical note

Publisher Copyright:
CLEO 2024 © Optica Publishing Group 2024 © 2024 The Author(s)

Keywords

  • Electro-optic effects
  • Media
  • Optical interferometry
  • Optical variables measurement
  • Phase measurement
  • X-ray lasers
  • X-rays

Fingerprint

Dive into the research topics of 'Quantum interferometry with x-rays'. Together they form a unique fingerprint.

Cite this