Quantitative structural analysis of organic thin films: An x-ray diffraction study

Engineering & Materials Science

• Diffraction 98%
• Structural analysis 93%
• Thin films 86%
• X rays 83%
• Atomic force microscopy 78%
• Annealing 60%
• Growth temperature 49%
• Crystallites 44%
• Substrates 43%
• Sapphire 40%
• Temperature 36%
• Phase transitions 31%
• Iron 27%
• Surface roughness 25%

Physics & Astronomy

• structural analysis 100%
• x ray diffraction 79%
• thin films 47%
• atomic force microscopy 35%
• annealing 27%
• temperature 27%
• phase transformations 20%
• crystallites 20%
• sapphire 19%
• surface roughness 19%
• spacing 17%
• iron 16%

Chemical Compounds

• Atomic Force Microscopy 72%
• Annealing 72%
• Phthalocyanine 46%
• Surface Roughness 46%
• Crystallite 38%
• Time 33%
• Liquid Film 22%