Quantitative structural analysis of organic thin films: An x-ray diffraction study

Keyphrases

• X-ray Diffraction Study 100%
• Organic Thin Films 100%
• FePc 100%
• Quantitative Structural Analysis 100%
• Molecular Layer 60%
• Post Deposition 40%
• Atomic Force Microscopy 40%
• Annealing Time 40%
• In-situ Annealing 40%
• Temperature Effect 20%
• Structural Phase Transition 20%
• Bilayer Model 20%
• Surface Roughness 20%
• Diffraction 20%
• Sapphire Substrate 20%
• Interlayer Spacing 20%
• Crystallites 20%
• Substrate Temperature 20%
• Deposition Temperature 20%
• Stranski-Krastanov Growth 20%
• Quantitatively Analysis 20%
• Diffraction Data 20%
• Growth Temperature 20%
• Iron Phthalocyanine 20%

Engineering

• Ray Diffraction 100%
• Molecular Layer 100%
• Thin Films 100%
• Annealing Time 66%
• Atomic Force Microscopy 66%
• Sapphire Substrate 33%
• Deposition Temperature 33%
• Substrate Temperature 33%
• Growth Mode 33%
• Growth Temperature 33%
• Crystallite 33%

Material Science

• Thin Films 100%
• Film 33%
• Sapphire 33%
• Surface Roughness 33%
• Crystallite 33%