Pyroelectric measurement of surface layer: The case of thin film on dielectric substrate

D. Ehre, E. Mirzadeh, O. Stafsudd, I. Lubomirsky

Research output: Contribution to journalArticlepeer-review

11 Scopus citations

Abstract

We propose an extension of the periodic temperature change (Chynoweth) technique for the measurement of pyroelectric coefficient in the case of a pyroelectric thin film on an insulating (non-conductive) substrate. The modified technique adequately determines the pyroelectric coefficient of the film if its thickness is known. The method determines the pyroelectric coefficient of the substrate even if it is much smaller than that of the film. The method overestimates the thickness of the pyroelectric film and can be used as an estimate only. If the thickness of the pyroelectric film is not known, the method gives a product of the pyroelectric coefficient of the film and its thickness.

Original languageEnglish
Pages (from-to)41-49
Number of pages9
JournalFerroelectrics
Volume472
Issue number1
DOIs
StatePublished - 1 Jan 2014
Externally publishedYes

Bibliographical note

Publisher Copyright:
Copyright © 2014 Taylor & Francis Group, LLC.

Funding

The authors wish to thank the Minerva Foundation, the Israel Ministry of National Infrastructure and the US-Israel Binational Science Foundation for funding this research. I.L. specifically wishes to acknowledge the Nancy and Stephen Grand Research Center for Sensors and Security. The research is also made possible in part by the generosity of the Harold Perlman Family.

FundersFunder number
Israel Ministry of National Infrastructure
Minerva Foundation
United States-Israel Binational Science Foundation

    Keywords

    • Pyroelectric effect
    • surface pyroelectricity
    • thin films

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