Pseudo-dynamic fault isolation technique using backside emission microscopy - Case study, where all other methods fail

Keyphrases

• Isolation Method 100%
• Emission Microscopy 100%
• Pseudo-dynamic 100%
• Dynamic Fault 100%
• Fault Isolation 100%
• Failure Analysis 50%
• Physical Location 25%
• Noise Background 25%
• Operating Conditions 25%
• Process Variation 25%
• Photon Detection 25%
• Simple Technique 25%
• Detection Sensitivity 25%
• Advanced Tool 25%
• Dynamic Operation 25%
• Functional Failure 25%
• Logic Simulation 25%
• Sensitive Emission 25%
• Design Variations 25%
• Temporal Location 25%
• Failure Location 25%

Computer Science

• Failure Analysis 100%
• Case Study 100%
• Process Variation 50%
• Operating Condition 50%
• It Operation 50%
• Physical Location 50%
• Logic Simulation 50%

Engineering

• Failure Analysis 100%
• Process Variation 50%
• Detection Sensitivity 50%
• Contention 50%
• Marginals 50%