Protective measurements: extracting the expectation value by measuring a single particle

F. Piacentini, A. Avella, E. Rebufello, S. Virzi, R. Lussana, F. Federica Villa, A. Tosi, M. Gramegna, G. Brida, E. Cohen, L. Vaidman, I.P. Degiovanni, M. Genovese

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageAmerican English
Title of host publicationSPIE Photonics Europe, 2018
StatePublished - 2018

Bibliographical note

Place of conference:Strasbourg, France

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