Protecting cryptographic hardware against malicious attacks by nonlinear robust codes

Victor Tomashevich, Yaara Neumeier, Raghavan Kumar, Osnat Keren, Ilia Polian

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

20 Scopus citations

Abstract

Fault-based attacks against cryptographic circuits must be addressed by techniques that are different from approaches designed for random transient faults. We systematically investigate robust error-detecting codes that specifically target malicious attacks and guarantee minimal bounds on detection probability. Our study is based on FPGA-supported fault-injection campaigns on the circuit implementation of a recent lightweight block cipher and its sub-modules. We quantify the detection capabilities of different robust and non-robust codes with respect to both random faults and malicious attacks, as well as the required overheads. For the first time, we report performance of a novel punctured cubic code on actual cryptographic circuitry. Experimental results show that robust codes with a certain number of redundant bits have better detection properties in security context and higher predictability than their conventional linear counterparts.

Original languageEnglish
Title of host publicationProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages40-45
Number of pages6
ISBN (Electronic)9781479961559
DOIs
StatePublished - 18 Nov 2014
Event27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014 - Amsterdam, Netherlands
Duration: 1 Oct 20143 Oct 2014

Publication series

NameProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
ISSN (Print)1550-5774

Conference

Conference27th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2014
Country/TerritoryNetherlands
CityAmsterdam
Period1/10/143/10/14

Bibliographical note

Publisher Copyright:
© 2014 IEEE.

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