Projection of speckle patterns for 3D sensing

J. García; Z. Zalevsky; P. Garcia-Martinez; C. Ferreira; M. Teicher; Y. Beiderman

doi:10.1088/1742-6596/139/1/012026

Projection of speckle patterns for 3D sensing

J. García, Z. Zalevsky, P. Garcia-Martinez, C. Ferreira, M. Teicher, Y. Beiderman

University of Valencia

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

In this communication we present the use of projected speckle patterns coming from a phase random mask for sensing depths and thicknesses. The sensing is based on the change of the speckle pattern with propagation and the lack of correlation between speckle patterns recorded at different depths or lateral locations. The principle is used for mapping thickness of transparent media, for depth ranging and for 3D mapping of diffuse objects.

Original language	English
Article number	012026
Journal	Journal of Physics: Conference Series
Volume	139
DOIs	https://doi.org/10.1088/1742-6596/139/1/012026
State	Published - 2008

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Projection of speckle patterns for 3D sensing

Abstract

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