Process Variation-Aware Data path Employing Dual Mode Logic

  • A. Fish
  • , N. Shavit
  • , I. Stanger
  • , R. Taco

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Original languageAmerican English
Title of host publication2018 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)
StatePublished - 2018

Bibliographical note

Place of conference:Burlingame, CA, USA

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