Process Monitor Circuitry with measurement capability

Original language	American English
State	Published - 2019

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Shor, J., & Lisha, L. (2019). Process Monitor Circuitry with measurement capability. Washington, DC: U.S. Patent and Trademark Office.

Shor, J. (Inventor) ; Lisha, L. (Inventor). / Process Monitor Circuitry with measurement capability. Washington, DC: U.S. Patent and Trademark Office.

@misc{ae74190141654ca6a2a4c8d478b7dc05,

title = "Process Monitor Circuitry with measurement capability",

author = "J. Shor and L. Lisha",

year = "2019",

language = "American English",

publisher = "Washington, DC: U.S. Patent and Trademark Office",

type = "Patent",

}

Shor, J & Lisha, L, Process Monitor Circuitry with measurement capability.

Process Monitor Circuitry with measurement capability. / Shor, J. (Inventor); Lisha, L. (Inventor).
Washington, DC: U.S. Patent and Trademark Office.

Research output: Patent

TY - PAT

T1 - Process Monitor Circuitry with measurement capability

AU - Shor, J.

AU - Lisha, L.

PY - 2019

Y1 - 2019

M3 - Patent

PB - Washington, DC: U.S. Patent and Trademark Office

ER -

Shor J, Lisha L, inventors. Process Monitor Circuitry with measurement capability. 2019.