Probing origin of room temperature ferromagnetism in Ni ion implanted ZnO films with x-ray absorption spectroscopy

P. Srivastava; S. Ghosh; B. Joshi; P. Satyarthi; P. Kumar; D. Kanjilal; D. Buerger; S. Zhou; H. Schmidt; A. Rogalev; F. Wilhelm

doi:10.1063/1.3676260

Probing origin of room temperature ferromagnetism in Ni ion implanted ZnO films with x-ray absorption spectroscopy

P. Srivastava
, S. Ghosh
, B. Joshi
, P. Satyarthi
, P. Kumar
, D. Kanjilal
, D. Buerger
, S. Zhou
, H. Schmidt
, A. Rogalev
, F. Wilhelm

Research output: Contribution to journal › Article › peer-review

23 Scopus citations

Abstract

We report x-ray absorption at Zn and Ni K-edges in 200 keV Ni²⁺ ion implanted ZnO/sapphire films. The implantation fluences are 6×10 ¹⁵ and 2×10¹⁶ ions/cm², corresponding to 2% and 7% Ni in a ZnO matrix. The measurements reveal a marginal substitution of Ni in ZnO in both the films and also rule out the presence of ferromagnetic Ni metal clusters. The M-H and field cooled-zero field cooled measurements performed via SQUID magnetometry show that the films are ferromagnetic at room temperature, and the saturation magnetization of 2% Ni film is appreciably higher than that of 7% Ni film. The origin of ferromagnetism is understood on the basis of the oxygen vacancy mediated bound magnetic polaron model.

Original language	English
Article number	013715
Journal	Journal of Applied Physics
Volume	111
Issue number	1
DOIs	https://doi.org/10.1063/1.3676260
State	Published - 1 Jan 2012
Externally published	Yes

Bibliographical note

Funding Information:
Financial support from the Department of Science & Technology (DST), New Delhi, to carry out this work is gratefully acknowledged. One of us (P. Satyarthi) is thankful to University Grants Commission (UGC), New Delhi, for a fellowship. D.B. and H.S. acknowledge funding from the Bundesministerium für Bildung und Forschung (FKZ13N10144).

Funding

Financial support from the Department of Science & Technology (DST), New Delhi, to carry out this work is gratefully acknowledged. One of us (P. Satyarthi) is thankful to University Grants Commission (UGC), New Delhi, for a fellowship. D.B. and H.S. acknowledge funding from the Bundesministerium für Bildung und Forschung (FKZ13N10144).

Funders	Funder number
Department of Science and Technology, Ministry of Science and Technology, India
University Grants Commission
Bundesministerium für Bildung und Forschung	FKZ13N10144

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title = "Probing origin of room temperature ferromagnetism in Ni ion implanted ZnO films with x-ray absorption spectroscopy",

abstract = "We report x-ray absorption at Zn and Ni K-edges in 200 keV Ni2+ ion implanted ZnO/sapphire films. The implantation fluences are 6×10 15 and 2×1016 ions/cm2, corresponding to 2\% and 7\% Ni in a ZnO matrix. The measurements reveal a marginal substitution of Ni in ZnO in both the films and also rule out the presence of ferromagnetic Ni metal clusters. The M-H and field cooled-zero field cooled measurements performed via SQUID magnetometry show that the films are ferromagnetic at room temperature, and the saturation magnetization of 2\% Ni film is appreciably higher than that of 7\% Ni film. The origin of ferromagnetism is understood on the basis of the oxygen vacancy mediated bound magnetic polaron model.",

author = "P. Srivastava and S. Ghosh and B. Joshi and P. Satyarthi and P. Kumar and D. Kanjilal and D. Buerger and S. Zhou and H. Schmidt and A. Rogalev and F. Wilhelm",

note = "Funding Information: Financial support from the Department of Science \& Technology (DST), New Delhi, to carry out this work is gratefully acknowledged. One of us (P. Satyarthi) is thankful to University Grants Commission (UGC), New Delhi, for a fellowship. D.B. and H.S. acknowledge funding from the Bundesministerium f{\"u}r Bildung und Forschung (FKZ13N10144).",

year = "2012",

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doi = "10.1063/1.3676260",

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AU - Srivastava, P.

AU - Ghosh, S.

AU - Joshi, B.

AU - Satyarthi, P.

AU - Kumar, P.

AU - Kanjilal, D.

AU - Buerger, D.

AU - Zhou, S.

AU - Schmidt, H.

AU - Rogalev, A.

AU - Wilhelm, F.

N1 - Funding Information: Financial support from the Department of Science & Technology (DST), New Delhi, to carry out this work is gratefully acknowledged. One of us (P. Satyarthi) is thankful to University Grants Commission (UGC), New Delhi, for a fellowship. D.B. and H.S. acknowledge funding from the Bundesministerium für Bildung und Forschung (FKZ13N10144).

PY - 2012/1/1

Y1 - 2012/1/1

N2 - We report x-ray absorption at Zn and Ni K-edges in 200 keV Ni2+ ion implanted ZnO/sapphire films. The implantation fluences are 6×10 15 and 2×1016 ions/cm2, corresponding to 2% and 7% Ni in a ZnO matrix. The measurements reveal a marginal substitution of Ni in ZnO in both the films and also rule out the presence of ferromagnetic Ni metal clusters. The M-H and field cooled-zero field cooled measurements performed via SQUID magnetometry show that the films are ferromagnetic at room temperature, and the saturation magnetization of 2% Ni film is appreciably higher than that of 7% Ni film. The origin of ferromagnetism is understood on the basis of the oxygen vacancy mediated bound magnetic polaron model.

AB - We report x-ray absorption at Zn and Ni K-edges in 200 keV Ni2+ ion implanted ZnO/sapphire films. The implantation fluences are 6×10 15 and 2×1016 ions/cm2, corresponding to 2% and 7% Ni in a ZnO matrix. The measurements reveal a marginal substitution of Ni in ZnO in both the films and also rule out the presence of ferromagnetic Ni metal clusters. The M-H and field cooled-zero field cooled measurements performed via SQUID magnetometry show that the films are ferromagnetic at room temperature, and the saturation magnetization of 2% Ni film is appreciably higher than that of 7% Ni film. The origin of ferromagnetism is understood on the basis of the oxygen vacancy mediated bound magnetic polaron model.

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Probing origin of room temperature ferromagnetism in Ni ion implanted ZnO films with x-ray absorption spectroscopy

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