Abstract
We report x-ray absorption at Zn and Ni K-edges in 200 keV Ni2+ ion implanted ZnO/sapphire films. The implantation fluences are 6×10 15 and 2×1016 ions/cm2, corresponding to 2% and 7% Ni in a ZnO matrix. The measurements reveal a marginal substitution of Ni in ZnO in both the films and also rule out the presence of ferromagnetic Ni metal clusters. The M-H and field cooled-zero field cooled measurements performed via SQUID magnetometry show that the films are ferromagnetic at room temperature, and the saturation magnetization of 2% Ni film is appreciably higher than that of 7% Ni film. The origin of ferromagnetism is understood on the basis of the oxygen vacancy mediated bound magnetic polaron model.
Original language | English |
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Article number | 013715 |
Journal | Journal of Applied Physics |
Volume | 111 |
Issue number | 1 |
DOIs | |
State | Published - 1 Jan 2012 |
Externally published | Yes |
Bibliographical note
Funding Information:Financial support from the Department of Science & Technology (DST), New Delhi, to carry out this work is gratefully acknowledged. One of us (P. Satyarthi) is thankful to University Grants Commission (UGC), New Delhi, for a fellowship. D.B. and H.S. acknowledge funding from the Bundesministerium für Bildung und Forschung (FKZ13N10144).
Funding
Financial support from the Department of Science & Technology (DST), New Delhi, to carry out this work is gratefully acknowledged. One of us (P. Satyarthi) is thankful to University Grants Commission (UGC), New Delhi, for a fellowship. D.B. and H.S. acknowledge funding from the Bundesministerium für Bildung und Forschung (FKZ13N10144).
Funders | Funder number |
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Department of Science and Technology, Ministry of Science and Technology, India | |
University Grants Commission | |
Bundesministerium für Bildung und Forschung | FKZ13N10144 |