Abstract
Analyses and simulations have shown that interconnect shielding can replace a large fraction of the delay buffers used to achieve timing goals through a useful skew clock design methodology. Immunity from process, operation, and environmental variations in nanoscale CMOS technology clock designs are essential, thus making predictable delays and useful skews highly important. We examine interconnect shielding intradie within-die (WID) and interdie die-to-die (D2D) variations under a wide variety of (P,V,T) corners, and show their applicability and ability to achieve clock design timing goals. The analysis is based on post-silicon measurements of a novel shielded interconnect ring oscillator in a 16-nm test chip supported by a rigorous provable estimation methodology.
Original language | English |
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Article number | 8844248 |
Pages (from-to) | 4875-4882 |
Number of pages | 8 |
Journal | IEEE Transactions on Electron Devices |
Volume | 66 |
Issue number | 11 |
DOIs | |
State | Published - Nov 2019 |
Bibliographical note
Publisher Copyright:© 1963-2012 IEEE.
Funding
Manuscript received July 8, 2019; revised August 14, 2019; accepted August 27, 2019. Date of publication September 18, 2019; date of current version October 29, 2019. This work was supported by the Israel Chief Scientist through the HiPer Consortium of the MAGNET Program. The review of this article was arranged by Editor M. S. Bakir. (Corresponding author: Shmuel Wimer.) B. Frankel and S. Wimer are with the Engineering Faculty, Bar-Ilan University, Ramat Gan 52900, Israel (e-mail: [email protected]; [email protected]).
Funders | Funder number |
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Israel Chief Scientist |
Keywords
- Clock trees
- delay tuning
- interconnections
- process variations
- ring oscillator (RO)
- useful skew
- wire shielding