Positional order and thermal expansion of surface crystalline N-alkane monolayers

B. M. Ocko, E. B. Sirota, M. Deutsch, E. DiMasi, S. Coburn, Joe Strzalka, Songyan Zheng, Andrey Tronin, Thomas Gog, Chitra Venkataraman

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22 Scopus citations


The surface crystalline monolayer formed at the liquid-vapor interface of the n-alkene eicosane was studied using high resolution synchrotron grazing incidence X ray diffraction (GID) measurement. The diffraction peaks were found to be resolution limited indicating that the domain size is at least on the order of 1 micrometer. The temperature variation in the GID peak position was accurately measured. The coefficient of thermal expansion was found to be comparable to the coefficient measured in the bulk rotator phase.

Original languageEnglish
Article number032602
Pages (from-to)326021-326023
Number of pages3
JournalPhysical Review E
Issue number3 I
StatePublished - Mar 2001


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