TY - JOUR
T1 - Plasmonics Yields Efficient Electron Transport via Assembly of Shell-Insulated Au Nanoparticles
AU - Li, Chuanping
AU - Cahen, David
AU - Wang, Ping
AU - Li, Haijuan
AU - Zhang, Jie
AU - Jin, Yongdong
N1 - Publisher Copyright:
© 2018 The Author(s)
PY - 2018/10/26
Y1 - 2018/10/26
N2 - Junctions built from metallic nanoparticles (NPs) can circumvent the diffraction limit and combine molecular/nanoelectronics with plasmonics. However, experimental advances in plasmon-assisted electron transport at the nanoscale have been limited. We construct junctions of a robust, molecule-free, suspended film, built solely from AuNPs, capped by SiO2 shells (Au@SiO2), which give insulating tunneling gaps up to 3.6 nm between the NPs. Current measured across monolayers of such AuNPs shows ultra-long-range, plasmon-enabled electron transport (P-transport), beyond the range of normal electron tunneling across insulators. This finding challenges the present understanding of electron transport in such systems and opens possibilities for future combinations of plasmonics and nanoelectronics.
AB - Junctions built from metallic nanoparticles (NPs) can circumvent the diffraction limit and combine molecular/nanoelectronics with plasmonics. However, experimental advances in plasmon-assisted electron transport at the nanoscale have been limited. We construct junctions of a robust, molecule-free, suspended film, built solely from AuNPs, capped by SiO2 shells (Au@SiO2), which give insulating tunneling gaps up to 3.6 nm between the NPs. Current measured across monolayers of such AuNPs shows ultra-long-range, plasmon-enabled electron transport (P-transport), beyond the range of normal electron tunneling across insulators. This finding challenges the present understanding of electron transport in such systems and opens possibilities for future combinations of plasmonics and nanoelectronics.
KW - Electronic Materials
KW - Materials Science
KW - Nanomaterials
UR - http://www.scopus.com/inward/record.url?scp=85066249854&partnerID=8YFLogxK
U2 - 10.1016/j.isci.2018.09.022
DO - 10.1016/j.isci.2018.09.022
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C2 - 30336365
AN - SCOPUS:85066249854
SN - 2589-0042
VL - 8
SP - 213
EP - 221
JO - iScience
JF - iScience
ER -