Plasma dispersion effect based super-resolved imaging in silicon

Maor Tiferet, Hadar Pinhas, Omer Wagner, Yossef Danan, Meir Danino, Zeev Zalevsky, Moshe Sinvani

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Scopus citations


In this paper we present a new method for shaping of a pulsed IR (λ=1550 nm) laser beam in silicon. The shaping is based on plasma dispersion effect (PDE). The shaping is done by a second pulsed pump laser beam at 532 nm which simultaneously and collinearly illuminates the silicon's surface with the IR beam. Following the PDE, and in proportion to its spatial intensity distribution, the 532 nm laser beam shapes the point spread function (PSF) by controlling the lateral transmission of the IR probe beam. The use of this probe in laser scanning microscope allows imaging and wide range of contactless electrical measurements in silicon integrated circuits (IC) being under operation e.g. for failure analysis purposes. We propose this shaping method to overcome the diffraction resolution limit in silicon microscopy on and deep under the silicon surface depending on the wavelength of the pump laser and its temporal pulse width. This approach is similar to the stimulated emission depletion (STED) concept previously introduced in scanning fluorescence microscopy.

Original languageEnglish
Title of host publicationNanoscale Imaging, Sensing, and Actuation for Biomedical Applications XVI
EditorsDror Fixler, Ewa M. Goldys, Dan V. Nicolau
ISBN (Electronic)9781510624245
StatePublished - 2019
EventNanoscale Imaging, Sensing, and Actuation for Biomedical Applications XVI 2019 - San Francisco, United States
Duration: 3 Feb 20194 Feb 2019

Publication series

NameProgress in Biomedical Optics and Imaging - Proceedings of SPIE
ISSN (Print)1605-7422


ConferenceNanoscale Imaging, Sensing, and Actuation for Biomedical Applications XVI 2019
Country/TerritoryUnited States
CitySan Francisco

Bibliographical note

Publisher Copyright:
© 2019 SPIE.


  • Failure analysis
  • Imaging
  • Silicon photonics
  • Super resolution


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