Planar Hall effect in epitaxial thin films of magnetite

Y. Bason, L. Klein, H. Q. Wang, J. Hoffman, X. Hong, V. E. Henrich, C. H. Ahn

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16 Scopus citations


We measured the planar Hall effect (PHE) of magnetite (Fe3 O4) films between 150 and 350 K. The PHE was measured both with a constant magnetic field rotating in the plane of the sample and in a remanent state after applying a field in specific directions. The PHE amplitude decreases with temperature; however, it changes little between 300 and 350 K. The remanent PHE signal is as high as 10 VA, larger than previously observed in manganite films. We also measured the PHE in the remanent state and found that its magnitude and stability make it a viable candidate for magnetic random access memory applications.

Original languageEnglish
Article number09J507
JournalJournal of Applied Physics
Issue number9
StatePublished - 2007

Bibliographical note

Funding Information:
One of the authors (L.K.) acknowledges support by the Israel Science Foundation founded by the Israel Academy of Sciences and Humanities. Another author (C. A.) acknowledges primary support from the National Science Foundation under Contract Nos. MRSEC DMR 0520495 and DMR 0134721 and ONR, along with support from the Packard and Sloan Foundations. Another one of the author (V.E.H.) acknowledges support from the National Science Foundation under Contract No. MRSEC DMR 0520495 and the U.S. Department of Energy Grant No. DE-FG02-OOER45844.


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