Photon migration in layered media

H. Taitelbaum, S. Havlin, Ralph Nossal, J. Kiefer, G. W. Weiss, R. Bonner

Research output: Contribution to journalArticlepeer-review

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Surface emission profiles and related functions are computed for particles (photons) migrating within a semiinfinite medium containing a surface layer whose absorbance differs from that of the underlying layer. Photons are assumed to be inserted at a single point on the surface. In certain cases distinct features appear in the emission profiles which enable determination of the thickness of the top layer and of the absorption coefficients of both layers. Computations are performed to provide estimates of parameter ranges for which the presence of one layer distorts photon emission profiles from the other. Several ancillary functions are calculated, including the absorbance profile as a function of depth, the expected path length of photons that are reemitted at a distance p from the point of insertion, and the average depth probed by those reemitted photons.

Original languageEnglish
Pages (from-to)3382-3391
Number of pages10
JournalApplied Optics
Issue number16
StatePublished - Aug 1988


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