Phase segregation, Cu migration and junction formation in Cu(In, Ga)Se₂

Keyphrases

• Electromigration 100%
• Junction Formation 100%
• Phase Segregation 100%
• Cu Depletion 100%
• Cu(In,Ga)Se2 100%
• Defect Layer 100%
• Cu Migration 100%
• Phase Diagram 50%
• Open-circuit Voltage 50%
• Structural Transformation 50%
• Light-induced 50%
• Electrical Properties 50%
• Bulk Phase 50%
• Metastability 50%
• Cu Surface 50%
• Band Bending 50%
• Self-limiting 50%
• Positively Charged Surface 50%
• Surface Defects 50%
• Surface Composition 50%
• Capacitance Measurement 50%
• Quasi-binary 50%
• Polycrystalline Cu 50%
• Surface Acting 50%
• Phase Junction 50%
• Local Defect 50%
• Chalcopyrite Structure 50%
• Cu-poor 50%
• Cu(In,Ga)Se2 Film 50%
• Cu(In,Ga)Se2 Solar Cells 50%
• In2Se3 50%
• Solar One 50%
• Bare Surfaces 50%
• Cu2Se 50%
• CuInS 50%
• Defect Relaxation 50%

Chemistry

• Liquid Film 100%
• Phase Diagrams 50%
• Relaxation 50%
• Solar Cell 50%
• Electrical Property 50%
• Capacitance Measurement 50%
• Band Bending 50%
• Structure 50%
• Surface Composition 50%
• Surface Defect 50%
• Chalcopyrite 50%

Material Science

• Film 100%
• Electronic Circuit 50%
• Solar Cell 50%
• Surface Structure 50%
• Capacitance Measurement 50%
• Metastability 50%
• Surface Defect 50%