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Perspective on III-V barrier detectors
Philip C. Klipstein
SemiConductor Devices
Research output
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Contribution to journal
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Article
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peer-review
19
Scopus citations
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Keyphrases
III-V
100%
Barrier Detectors
100%
Depletion Region
50%
Photodiode
50%
T2SL
50%
Generation-recombination
50%
Low Mobility
25%
High Performance
25%
High Mobility
25%
Dark Current
25%
Diffusion Length
25%
Absorber
25%
Detector Array
25%
Device Architecture
25%
Diffusion Limit
25%
Recombination Mechanism
25%
Bulk Alloys
25%
Majority Carriers
25%
Long Lifetime
25%
Auger Recombination
25%
Non-metallic
25%
Wide Bandgap
25%
Band Alignment
25%
InSb
25%
Narrow Gap
25%
Challenges for the Future
25%
GaSb
25%
Thermal Generation
25%
Type-II Superlattice
25%
InAsSb
25%
Long-wave Infrared
25%
Generation-recombination Current
25%
Mid-wave
25%
III-V Materials
25%
Barrier Materials
25%
Performance Barrier
25%
Bulk-type
25%
Dual-band Photodetector
25%
Atmospheric Transparency Window
25%
Unity Gain
25%
Short Lifetime
25%
Engineering
Depletion Region
100%
Photodiode
100%
Photodetector
50%
Detector Array
50%
Bulk Alloy
50%
Future Design
50%
Recombination Mechanism
50%
Superlattice
50%
Barrier Performance
50%
Barrier Material
50%
Diffusion Length
50%
Auger Recombination
50%
Material Science
Superlattice
100%