Performance Benchmarking of FinFET- and TFET-Based STT-MRAM Bitcells Operating at Ultra-Low Voltages

Santiago S. Pérez, Alessandro Bedoya, Luis Miguel Prócel, Ramiro Taco

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

STT-MRAMs have emerged as the leading candidate of on-chip technology for nonvolatile cache applications. In this paper, DMTJs are used to build STT-MRAMs at the circuit level with a reduced switching current benchmarking the TFET technology model and a calibrated 10nm-FinFET technology model to explore the best configuration in the ultralow voltage domain for writing operation in terms of energy-efficiency and area. Simulation results showed that the TFET-based solutions are the most energy-efficiency in terms of the EDP index with an average EDP 57.77% lower than the FinFET-based configurations. TFET-based bitcells had a 40.23% smaller delay and 34.11% less writing energy compared to the FinFET counterparts. Finally, a standby power analysis was carried out.

Original languageEnglish
Title of host publicationLASCAS 2023 - 14th IEEE Latin American Symposium on Circuits and Systems, Proceedings
EditorsMonica Karel Huerta
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665457057
DOIs
StatePublished - 2023
Externally publishedYes
Event14th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2023 - Quito, Ecuador
Duration: 27 Feb 20233 Mar 2023

Publication series

NameLASCAS 2023 - 14th IEEE Latin American Symposium on Circuits and Systems, Proceedings

Conference

Conference14th IEEE Latin American Symposium on Circuits and Systems, LASCAS 2023
Country/TerritoryEcuador
CityQuito
Period27/02/233/03/23

Bibliographical note

Publisher Copyright:
© 2023 IEEE.

Keywords

  • DMTJ
  • Fin-FET
  • MTJ
  • Magnetic Tunnel Junction
  • STT-MRAM
  • Spintronics
  • TFET
  • Tunnel FET
  • leakage current

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