Abstract
The growing field of oxide-electronics demands adequate fabrication methods that do not impair the material's beneficial properties. To this end, we present a modified lift-off lithography method replacing the conventional polymer mask with an AlOx based mask. It can sustain the high-temperature and reactive gasses conditions commonly needed for oxide deposition, and is effectively wet-etched in dilute NaOH solutions. Here we demonstrate patterning of VO2 films. With its metal-insulator transition (MIT) near room temperature, it is attractive for various applications including sensors and transistors. But patterning is challenging since its properties are very sensitive to fabrication processes. We demonstrate patterning of 3 μm wide VO2 electrodes and show they preserve the MIT magnitude and epitaxial growth of the non-patterned films. Some thinning of the VO2 is also observed. This process can be useful for patterning other materials that require harsh deposition conditions, and are resilient to low NaOH concentrations.
Original language | English |
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Article number | 046302 |
Journal | Materials Research Express |
Volume | 1 |
Issue number | 4 |
DOIs | |
State | Published - Dec 2015 |
Bibliographical note
Publisher Copyright:© 2014 IOP Publishing Ltd.
Funding
We thank J Grinblat, Y Fleger and G Cohen-Taguri for help in characterization, and N Chejanovsky for useful conversations. This research was supported by the ISRAEL SCIENCE FOUNDATION (grant No. 727/11).
Funders | Funder number |
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Israel Science Foundation | 727/11 |
Keywords
- AlO
- High temperature
- Lift-off
- Patterning
- Thin film
- VO
- Vanadium dioxide