Pattern projection for subpixel resolved imaging in microscopy

Research output: Contribution to journalArticlepeer-review

40 Scopus citations


In this paper, we present a new approach providing super resolved images exceeding the geometrical limitation given by the detector pixel size of the imaging camera. The concept involves the projection of periodic patterns on top of the sample, which are then investigated under a microscope. Combining spatial scanning together with proper digital post-processing algorithm yields the improved geometrical resolution enhancement. This new method is especially interesting for microscopic imaging when the resolution of the detector is lower than the resolution due to diffraction.

Original languageEnglish
Pages (from-to)115-120
Number of pages6
Issue number2
StatePublished - Feb 2007

Bibliographical note

Funding Information:
Javier Garcia acknowledges the support of the Spanish Ministry of Science and Education and the Ministry of Science and Technology under the codes PR-2004-0543 and FIS2004-06947-C02-01.


  • Geometrical limitation
  • Microscopy


Dive into the research topics of 'Pattern projection for subpixel resolved imaging in microscopy'. Together they form a unique fingerprint.

Cite this