Pattern projection for subpixel resolved imaging in microscopy

Dror Fixler; Javier Garcia; Zeev Zalevsky; Aryeh Weiss; Mordechai Deutsch

doi:10.1016/j.micron.2006.07.007

Pattern projection for subpixel resolved imaging in microscopy

Dror Fixler, Javier Garcia, Zeev Zalevsky, Aryeh Weiss, Mordechai Deutsch

University of Valencia

Research output: Contribution to journal › Article › peer-review

40 Scopus citations

Abstract

In this paper, we present a new approach providing super resolved images exceeding the geometrical limitation given by the detector pixel size of the imaging camera. The concept involves the projection of periodic patterns on top of the sample, which are then investigated under a microscope. Combining spatial scanning together with proper digital post-processing algorithm yields the improved geometrical resolution enhancement. This new method is especially interesting for microscopic imaging when the resolution of the detector is lower than the resolution due to diffraction.

Original language	English
Pages (from-to)	115-120
Number of pages	6
Journal	Micron
Volume	38
Issue number	2
DOIs	https://doi.org/10.1016/j.micron.2006.07.007
State	Published - Feb 2007

Bibliographical note

Funding Information:
Javier Garcia acknowledges the support of the Spanish Ministry of Science and Education and the Ministry of Science and Technology under the codes PR-2004-0543 and FIS2004-06947-C02-01.

Funding

Javier Garcia acknowledges the support of the Spanish Ministry of Science and Education and the Ministry of Science and Technology under the codes PR-2004-0543 and FIS2004-06947-C02-01.

Funders	Funder number
Spanish Ministry of Science and Education
Ministry of Science and Technology, Taiwan	FIS2004-06947-C02-01, PR-2004-0543

Keywords

Geometrical limitation
Microscopy

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10.1016/j.micron.2006.07.007

Cite this

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title = "Pattern projection for subpixel resolved imaging in microscopy",

abstract = "In this paper, we present a new approach providing super resolved images exceeding the geometrical limitation given by the detector pixel size of the imaging camera. The concept involves the projection of periodic patterns on top of the sample, which are then investigated under a microscope. Combining spatial scanning together with proper digital post-processing algorithm yields the improved geometrical resolution enhancement. This new method is especially interesting for microscopic imaging when the resolution of the detector is lower than the resolution due to diffraction.",

keywords = "Geometrical limitation, Microscopy",

author = "Dror Fixler and Javier Garcia and Zeev Zalevsky and Aryeh Weiss and Mordechai Deutsch",

note = "Funding Information: Javier Garcia acknowledges the support of the Spanish Ministry of Science and Education and the Ministry of Science and Technology under the codes PR-2004-0543 and FIS2004-06947-C02-01.",

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doi = "10.1016/j.micron.2006.07.007",

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AU - Zalevsky, Zeev

AU - Weiss, Aryeh

AU - Deutsch, Mordechai

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Pattern projection for subpixel resolved imaging in microscopy

Abstract

Bibliographical note

Funding

Keywords

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